The College of Science at the University of Karbala organized a training course titled “Differences Between SEM, AFM, and TEM Microscopic Examinations.”

The course aimed to distinguish between the three microscopic techniques, highlight the physical parameters obtained from each, and identify the strengths and limitations of each method.

It also covered the principles and mechanisms of each examination, providing a detailed explanation of how microscopic images are formed, the magnification levels, the type of radiation used, and the types of lenses involved.

The course concluded with a clear comparison of the three techniques, offering insights into which method is most suitable based on the specific parameters required for each examination.